3D and 4D Reconstruction of Dislocations
in Electron Microscopy
Satoshi
Hata1*, Hikaru Saito1, Mitsuhiro
Murayama1,2,3
1 Kyushu University, Kasuga,
Fukuoka 816-8580, Japan
2 Virginia Tech, Blacksburg,
VA 24061, USA
3 Pacific Northwest National
Laboratory, WA 99532, USA
ABSTRACT: The
combination of in-situ and three-dimensional (3D) in transmission electron
microscopy (TEM) is one of the emerging topics of recent advanced electron
microscopy research. Among
various kinds of in-situ TEM functions,
there have been only several examples of in-situ 3D TEM for material
deformation dynamics. This talk will review the current achievement of 3D
material deformation imaging in TEM. Morphological changes in a deformable
specimen and dislocation movements in a crystalline specimen have been visualized
in three dimensions at a time resolution of several minutes using TEM combined
with tomographic reconstruction techniques. This talk will also discuss
technical issues on developing 3D imaging methods of dislocation dynamics in
TEM from various aspects.
Keywords：Transmission
electron microscopy (TEM); Electron tomography (ET); Dislocation dynamics;
Diffraction contrast; In-situ observation; Plastic deformation
S. Hata has been working at the Faculty of Engineering Sciences at Kyushu University from 1994 and received his degree of Ph.D. in 2001 from Kyushu University. He is now a professor of the Department of Advanced Materials Science and Engineering and the Ultramicroscopy Research Center at Kyushu University. He has published more than 150 papers and has been serving as an editorial board member of Microscopy (https://academic.oup.com/jmicro).