Electron Microscopy- and Synchrotron Radiation-based Techniques for Multiscale and Multidimensional High Throughput Characterization

Xiaoxu Huang^1*, Guilin Wu¹, Xianyan Zhong^2**, Zhijun Li³

¹ Chongqing University, Chongqing, 400045, China

² Tsinghua University, Beijing, 100084, China

³ Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800, China

 ABSTRACT: In recent years, significant progress has been made in the development of electron microscopy- and synchrotron radiation-based techniques that enable multiscale and multidimensional high throughput characterization of microstructural, crystallographic, and compositional parameters and local mechanical and physical properties for crystalline materials. The high throughput characterization is achieved either by 2D, 3D, or 4D mapping or imaging of specific parameters to quantify multiple parameters and local properties or by integrating different techniques in one microscope or beamline to enable concurrent characterization of different parameters and local properties. In this presentation, examples of applying these techniques to achieve new discoveries in materials science will be shown, and future development of high throughput characterization techniques will be discussed.    

 Figure 1.  3D reconstruction of dislocations in a solid solution treated and quenched Al alloy. Different colors represent different Burgers vectors of <110> type.

Keywords: Electron microscopy; synchrotron radiation; high throughput characterization.